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近五年研究主題：
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Low-Power CAM
Design and Applications in
Random-Number Generators,
Distribution-Compensable RNG,
Jitter Generators and Mirror
Delay-lines.
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Multi-dimensional Memory Test
and Repair.
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Simple
Communication Codes Applied in
Bus/TSV/Interconnect
Power-Reduction and Repairing
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Berger Codes,
Residue Codes,
QR Codes,
Hamming Codes,
LDPC, etc.
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Interconnect
Repairing for 3D-ICs
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Inductive
Fault Analysis and IDDQ Testing
for 3D FinFET Circuits.
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